With iQT, you are no longer limited by the technology choices of software vendors or chained to infrastructure requirements of their products. Its unique approach and methodology has gained worldwide recognition. IEC is a significant step forward in reliability prediction when compared to older reliability standards. The IEC module provides models for reliability prediction of electronic components, optical cards, printed circuit boards and equipments, which takes directly into account the influence of the environment.
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Its unique approach and methodology has gained worldwide recognition. IEC is a significant step forward in reliability prediction when compared to older reliability standards. The IEC module provides models for reliability prediction of electronic components, optical cards, printed circuit boards and equipments, which takes directly into account the influence of the environment.
Failures related to component soldering are included in the component failure rate. This technical report provides elements to calculate failure rate of mounted electronic components.
It makes equipment reliability optimization studies easier to carry out, thanks to the introduction of influence factors. Powerful and user friendly IEC standard reliability prediction software Linked block facility reduces repetitive data entry Redundancy modeling including hot standby Multi systems within the same project Extensive component libraries to reduce entry time Multi document interface allows easy transfer of data Powerful charting facilities The following referenced documents are indispensable for the application of this method.
For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document including any amendments applies.
Each reliability prediction module is designed to analyse and calculate component, sub system and system failure rates, including Mean Time Between Failure MTBF , in accordance with the appropriate standard. These powerful facilities transfer as much of the available information as possible, saving you valuable time and effort. This valuable feature comes in especially handy when it is necessary to transfer data from one project or library to another. Users can construct hierarchical breakdowns of systems with no restrictions on block numbers or levels of indenture.
As new sub blocks and components are added, ITEM ToolKit automatically recalculates all dependent failure rates to take account of new information. Powerful global editing facilities are available for performing "what if" evaluations.
These facilities enable you to experiment with temperature, environmental and stress settings and see how your system performance will vary.
Functional Safety for Integrated Circuits Used in Variable Speed Drives
Press the Enter key or click the Search Icon to get general search results 2. Click a suggested result to go directly to that page 3. Click Search to get general search results based on this suggestion 4. Variable speed drives now play an important part in implementing functional safety.
IEC TR 62380 Failure Rates
IEC TR 62380