Exposure to absolute maximum rating conditions for extended periods of time may affect reliability. Continuous Plastic DIP The charge pumps will operate with polarized or non-polarized capacitors ranging from 0. Each block is described below. The transmitter outputs are protected against infinite short-circuits to ground without degradation in reliability.
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The series is available in plastic and ceramic DIP and SOIC packages operating over the commercial, industrial and military temperature ranges. Exposure to absolute maximum rating conditions for extended periods of time may affect reliability.
The charge pumps will operate with polarized or non-polarized capacitors ranging from 0. Each block is described below. The transmitter outputs are protected against infinite short-circuits to ground without degradation in reliability.
Figure 1. This ensures that the receiver is virtually immune to noisy transmission lines. The input thresholds are 0. Should an input be left unconnected, a 5KOhm pulldown resistor to ground will commit the output of the receiver to a high state.
Figure 3. Charge Pump — Phase 1 In actual system applications, it is quite possible for signals to be applied to the receiver inputs before power is applied to the receiver circuitry. In this case an RS signal from the PC will appear on the receiver input at the printer.
When the printer power is turned on, the receiver will operate normally. All of these enhanced devices are fully protected. Charge Pump The charge pump is a Sipex—patented design 5,, and uses a unique approach compared to older less—efficient designs. The charge pump still requires four external capacitors, but uses a four—phase voltage shifting technique to attain symmetrical 10V power supplies. There is a free—running oscillator that controls the four phases of the voltage shifting.
A description of each phase follows. Phase 3 — VDD charge storage — The third phase of the clock is identical to the first phase — the charge transferred in C1 produces —5V in the negative terminal of C1, which is applied to the negative side of capacitor C2.
Charge Pump — Phase 2 Rev. Charge Pump Waveforms be symmetrical. The clock rate for the charge pump typically operates at 15kHz. The external capacitors can be as low as 0. Charge Pump — Phase 4 Rev. Table 1 defines the truth table for the wake—up function. With only the receivers activated, the SPE typically draws less than 5A supply current. In the case of a modem interfaced to a computer in power down mode, the Ring Indicator RI signal from the modem would be used to "wake up" the computer, allowing it to accept data transmission.
After the ring indicator signal has propagated through the SPE receiver, it can be used to trigger the power management circuitry of the computer to power up the microprocessor, and bring the SD pin of the SPE to a logic high, taking it out of the shutdown mode. The receiver propagation delay is typically 1s. The ESD structure is improved over our previous family for more rugged applications and environments sensitive to electro-static discharges and associated transients. The simulation is performed by using a test model as shown in Figure 9.
For system manufacturers, they must guarantee a certain amount of ESD protection since the system itself is exposed to the outside environment and human presence.
Wake-up Function Truth Table. ESD Test Circuit for Human Body Model with IEC is that the system is required to withstand an amount of static electricity when ESD is applied to points and surfaces of the equipment that are accessible to personnel during normal usage. The test circuit for IEC is shown on Figure This simulates an electrically charged person ready to connect a cable onto the rear of the system only to find an unpleasant zap just before the person touches the back panel.
The high energy potential on the person discharges through an arcing path to the rear panel of the system before he or she even touches the system. Figure The current is transferred on to the keypad or the serial port of the equipment directly and then travels through the PCB and finally to the IC.
The circuit models in Figures 9 and 10 represent the typical ESD testing circuit used for all three methods. Now that the capacitor is charged, the second switch SW2 is on while SW1 switches off. The voltage stored in the capacitor is then applied through RS, the current limiting resistor, onto the device under test DUT.
The larger storage capacitor injects a higher voltage to the test point when SW2 is switched on. The lower current limiting resistor increases the current charge onto the test point. Variables with an air discharge such as approach speed of the object carrying the ESD potential to the system and humidity will tend to change the discharge current. For example, the rise time of the discharge current varies with the approach speed.
This method was devised to reduce the unpredictability of the ESD arc. The discharge current rise time is constant since the energy is directly transferred without the air-gap arc. Temperature Range Sipex does not assume any liability arising out of the application or use of any product or circuit described hereing; neither does it convey any license under its patent rights nor the rights of others.
SP232EEN-L - RS232 Transceiver, 2-drivers, Soic16
F capacitors in 3. This series is ideal for portable or hand-held applications such as notebook or palmtop computers. During shutdown, the supply current falls to less than 1? Exposure to absolute maximum rating conditions for extended periods of time may affect reliability and cause permanent damage to the device.
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